Spectral optical data, resistivity measurements, calculated absorptance and emittance measurements are presented along with photomicrographs of the surface structure for the various exposures to Ar ions. ![]() A scanning electron microscope recorded surface structure after exposure. Surface resistivity was used to determine changes in the electrical conductivity of the etched samples. Total emittance measurements were also recorded for some samples. From these measurements, values of solar absorptance were obtained. perspective music video, Ps4 remote play windows 10 download, Download screen. Spectral reflectance and transmittance measurements were made between 0.33 and 2.16 micron m using an integrating sphere after each exposure. portable cd player reviews, Indie music bus radio, Vinco osteosheath 4 120. Changes in the optical and electrical properties of the samples were used to characterize the exposure. Samples of polyimide and FEP were exposed to (0.5-1.0) keV Ar ions at ion current densities of (1.0-1/8) mA/sq cm for various exposure times. Optical and electrical properties of ion beam textured Kapton and Teflon An electron bombardment argon ion source was used to ion etch polyimide (Kapton) and fluorinated ethylene, FEP (Teflon).
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